Connecting manufacturers and customers brings reasonable costs
Testprobe We support selling offer the cantilever and vertical probe cards with various probe including WRe, CIS , Cobra, hbc, Bc,… for wafer yield testing. In order to meet customer’s various DUT materials and electrical specifications, we design suitable needle gauges, mechanisms and PCBs, and use engineering simulation to verify signal integrity and transmission speed, reduce noise interference, and ensure that we provide probe cards that meet customer quality
